Company Filing History:
Years Active: 2013-2017
Title: The Innovative Contributions of Frans De Nooij
Introduction
Frans De Nooij is a notable inventor based in Eindhoven, Netherlands. He has made significant contributions to the field of structured illumination microscopy, holding a total of 3 patents. His work focuses on enhancing imaging techniques, which are crucial for various scientific applications.
Latest Patents
Frans De Nooij's latest patents include an "Image sequence and evaluation method and system for structured illumination microscopy." This invention involves a method and apparatus for determining the height of multiple spatial positions on a specimen's surface. A light beam is projected onto the surface, which is then scanned along an optical axis at different positions. The reflected light is detected, and an envelope curve of intensity values is determined for each spatial position. The maximum of this envelope curve is selected to represent the height of the spatial position. Additionally, the spatial pattern is moved in a sequence of 2n steps in two spatial directions, enhancing the accuracy of the measurements.
Another significant patent is the "Structured illumination microscopy optical arrangement including projection artifact suppression element." This optical arrangement features both a projection path and an imaging path. The imaging path includes an imaging sensor and optical elements, while the projection path consists of a light generator and a pattern generating element, such as a spatial light modulator (SLM). A projector artifact suppression element (PASE) is also included to improve the accuracy of the system by reducing spatial harmonic errors and spurious intensity variations.
Career Highlights
Frans De Nooij is currently employed at Mitutoyo Corporation, where he continues to innovate in the field of microscopy. His work has been instrumental in advancing imaging technologies that are essential for research and development in various scientific disciplines.
Collaborations
Frans has collaborated with talented individuals such as Han Haitjema and Lukasz Redlarski. These collaborations have contributed to the successful development of his innovative patents.
Conclusion
Frans De Nooij's contributions to structured illumination microscopy demonstrate his commitment to advancing scientific imaging techniques. His innovative patents and collaborations highlight his role as a significant inventor in this field.