Company Filing History:
1 out of 4,123 
1 out of 8 Years Active: 1987-1990
Title: Frank N Ranallo: Innovator in X-ray Measurement Technology
Introduction
Frank N Ranallo is a notable inventor based in Madison, WI (US), recognized for his contributions to the field of X-ray measurement technology. He holds 2 patents that showcase his innovative approach to enhancing the accuracy and efficiency of X-ray beam analysis.
Latest Patents
Ranallo's latest patents include an "Instrument for the measurement of x-ray beam characteristics" and a "Method and apparatus for the measurement of X-ray sources." The first patent describes an instrument designed to measure the characteristics of an X-ray unit, utilizing two pairs of photo detectors to assess the kVp of the X-ray beam. It also features a single photo detector for measuring film exposure and another for monitoring the relative current in milliamps (mA). The instrument multiplexes signals and converts them to digital form for analysis by a microprocessor, providing a user-selectable display via a switch panel or remote control.
The second patent presents an X-ray measurement device that employs a pair of detector units receiving X-rays through filters of varying attenuation. This design minimizes orientation effects on the device concerning the X-ray beam axis. The outputs from the detector units are processed through variable gain amplifiers, which automatically adjust to maintain output voltages within a desired range. The integration of these outputs leads to a visual display of the measured kVp value.
Career Highlights
Throughout his career, Ranallo has worked with prominent organizations such as the Wisconsin Alumni Research Foundation and Radiation Measurements, Inc. His work has significantly impacted the field of medical imaging and X-ray technology.
Collaborations
Ranallo has collaborated with esteemed colleagues, including William C Zarnstorff and Larry A DeWerd, contributing to advancements in X-ray measurement techniques.
Conclusion
Frank N Ranallo's innovative patents and career achievements highlight his significant role in the development of X-ray measurement technology. His work continues to influence the field, ensuring greater accuracy and efficiency in medical imaging.
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