The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 1990
Filed:
Nov. 28, 1988
Applicant:
Inventors:
Frank N Ranallo, Madison, WI (US);
Larry A DeWerd, Madison, WI (US);
Joseph Muehlenkamp, Madison, WI (US);
Assignee:
Radiation Measurements, Inc., Middleton, WI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D / ;
U.S. Cl.
CPC ...
378207 ; 378 98 ;
Abstract
An instrument for measuring the characteristics of an x-ray unit includes two pairs of photo detectors to measure the kVp of the x-ray beam, a single photo detector to measure the relative film exposure produced by the beam and another single photo detector used to measure the relative current in milliamps (mA) of the x-ray unit. The instrument multiplexes the signals and converts them to digital form for storage and analysis by a microprocessor. The output is a display the contents of which is user selectable either by a switch panel or through use of a remote control unit.