Kraichtal, Germany

Frank Künzler

This inventor holds 1 USPTO granted patent and 2 EPO patents. Top assignee: Valeo Schalter Und Sensoren Gmbh. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Frank Künzler. Retrieved from https://idiyas.com/inventor/frank-künzler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Frank Künzler: Innovator in Distance Measurement Technology

Introduction

Frank Künzler is a notable inventor based in Kraichtal, Germany. He has made significant contributions to the field of distance measurement technology. His innovative approach has led to the development of a unique method and device for determining the distance to a target object.

Latest Patents

Künzler holds a patent for a method and device that involves transmitting electromagnetic waves to measure distances. The apparatus transmits a signal through a transmitter and receives the reflected signal from the target object. The reception signal is evaluated against a reference signal with a known phase difference, allowing for accurate distance measurement.

Career Highlights

Frank Künzler is associated with Valeo Schalter und Sensoren GmbH, where he applies his expertise in developing advanced sensor technologies. His work has been instrumental in enhancing the precision of distance measurement systems.

Collaborations

Künzler has collaborated with notable colleagues, including Udo Haberland and Robert Rehner. Their combined efforts have contributed to the advancement of innovative technologies in their field.

Conclusion

Frank Künzler's contributions to distance measurement technology exemplify the impact of innovative thinking in engineering. His patent and work at Valeo Schalter und Sensoren GmbH highlight his role as a key player in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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