Aachen, Germany

Frank Kuepper

This inventor holds 1 USPTO granted patent. Top assignee: Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.v.. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Frank Kuepper. Retrieved from https://idiyas.com/inventor/frank-kuepper-2p4ha1te

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 29(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Frank Kuepper: Innovator in Laser Technology

Introduction

Frank Kuepper is a notable inventor based in Aachen, Germany. He has made significant contributions to the field of laser technology, particularly in the shaping of workpieces using innovative methods.

Latest Patents

Kuepper holds a patent for a "Device and process for shaping workpieces with laser diode radiation." This invention involves a multiplicity of laser diodes that aim laser light directly onto the surface of a workpiece. The laser diodes are arranged according to the contour of the workpiece to be shaped. A detector unit determines the spatial shaping of the workpiece, while an evaluation and control unit adjusts process parameters based on the comparison of the actual and desired states of shaping.

Career Highlights

Frank Kuepper is associated with the Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung E.V., a leading research organization in Germany. His work has been instrumental in advancing laser applications in manufacturing processes.

Collaborations

Kuepper has collaborated with esteemed colleagues such as Eckhard Beyer and Volker Krause, contributing to various projects that enhance the capabilities of laser technology.

Conclusion

Frank Kuepper's innovative work in laser technology exemplifies the impact of modern inventions on manufacturing processes. His contributions continue to shape the future of this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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