Frank Kole

Title: Frank Kole: Innovator in Multi-Dimensional Metrology

Introduction

Frank Kole is a notable inventor based in San Jose, California. He has made significant contributions to the field of metrology and inspection technologies. His innovative work has led to the development of a patent that enhances the accuracy and efficiency of specimen analysis.

Latest Patents

Frank Kole holds a patent titled "Systems and methods for multi-dimensional metrology and/or inspection of a specimen." This patent describes methods for scanning specimens, such as bumped wafers, using partial oblique illumination to create detailed images of their structures. The process involves integrating the intensity of the images to determine the height of the structures, which may be proportional or inversely proportional to the height. Additionally, the patent outlines the use of bright field illumination to form images and detect defects in the specimens.

Career Highlights

Frank Kole is associated with Kla-Tencor Technologies Corporation, where he applies his expertise in metrology. His work at the company has been instrumental in advancing technologies that improve the precision of inspections in various applications. His innovative approach has positioned him as a key figure in the field.

Collaborations

Frank has collaborated with notable colleagues, including Tim S Wihl and Stephen Hiebert. These partnerships have fostered an environment of innovation and have contributed to the success of their projects.

Conclusion

Frank Kole's contributions to multi-dimensional metrology and inspection technologies exemplify his commitment to innovation. His patent and work at Kla-Tencor Technologies Corporation highlight his role as a leading inventor in this critical field.