Murphy, TX, United States of America

Frank J Mesa

This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Frank J Mesa. Retrieved from https://idiyas.com/inventor/frank-j-mesa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Frank J Mesa: Innovator in Semiconductor Testing Technology

Introduction

Frank J Mesa is a notable inventor based in Murphy, Texas. He has made significant contributions to the field of semiconductor testing. His innovative work has led to the development of a unique patent that enhances the efficiency of testing semiconductor devices.

Latest Patents

Frank J Mesa holds a patent for a "Probe card and temperature stabilizer for testing semiconductor devices." This invention provides an apparatus that includes a probe card with associated probe needles. A temperature stabilizer element is couplable to the probe card, which is designed to either raise or lower the temperature of the probe needles. This feature effectively reduces movement of the probe needles, thereby improving the accuracy of semiconductor testing.

Career Highlights

Frank J Mesa is currently employed at Texas Instruments Corporation, a leading company in the semiconductor industry. His work at Texas Instruments has allowed him to apply his innovative ideas in a practical setting, contributing to advancements in technology.

Collaborations

Some of his coworkers include John D Wolfe and Adolphus E McClanahan. Their collaboration in the field of semiconductor technology has fostered an environment of innovation and creativity.

Conclusion

Frank J Mesa's contributions to semiconductor testing technology exemplify the impact of innovation in the industry. His patent reflects a commitment to enhancing the efficiency and accuracy of testing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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