This inventor holds 1 USPTO granted patent. Top assignee: The Dow Chemical Company. Active years: 1989.
Company Filing History:
Years Active: 1989
Title: Frank J Knoll: Innovator in Thermal Analysis and X-ray Diffraction
Introduction
Frank J Knoll is a notable inventor based in Midland, MI (US). He has made significant contributions to the field of scientific apparatus, particularly in the area of thermal analysis and X-ray diffraction. His innovative work has led to the development of a unique device that enhances the understanding of material properties.
Latest Patents
Frank J Knoll holds a patent for a "Combined thermal analyzer and x-ray diffractometer." This invention describes a method for observing both structural and thermodynamic properties of materials simultaneously. The apparatus allows for a meaningful analysis in a very short time frame. The X-ray diffractometer is equipped with a rapid position-sensitive detector connected to a multichannel analyzer, which records and displays X-ray diffraction data from the sample over an angle of 20 degrees (two theta) or more. The thermal analyzer is preferably a differential scanning calorimeter. By correlating X-ray diffraction and thermal data taken simultaneously while the sample undergoes various temperatures and environments, structural changes corresponding to thermal events can be identified and elucidated.
Career Highlights
Frank J Knoll is associated with The Dow Chemical Company, where he has contributed to advancements in scientific research and development. His work has been instrumental in enhancing the capabilities of thermal analysis and X-ray diffraction technologies.
Collaborations
Throughout his career, Frank has collaborated with notable colleagues, including Timothy G Fawcett and William C Harris, Jr. These collaborations have further enriched his research and development efforts.
Conclusion
Frank J Knoll's innovative contributions to the field of thermal analysis and X-ray diffraction have paved the way for more efficient and effective material analysis. His patent reflects a significant advancement in scientific apparatus, showcasing his dedication to innovation and research.