Bretteville l'Orgueilleuse, France

Francois Varieras

This inventor holds 1 USPTO granted patent. Top assignee: Safran Data Systems. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Francois Varieras. Retrieved from https://idiyas.com/inventor/francois-varieras

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: The Innovations of Francois Varieras

Introduction

Francois Varieras is an accomplished inventor based in Bretteville l'Orgueilleuse, France. He has made significant contributions to the field of radiofrequency technology, particularly in the area of antenna alignment and communication.

Latest Patents

Francois holds a patent for a method and device for estimating the squint of an antenna and for following the pointing of an antenna implementing such a method and device, based on harmonic analysis. This innovative approach allows for a calibrated measurement of the angular misalignment of a radiofrequency antenna that is pointing towards a slow mobile radio transmitter. The method involves receiving radiofrequency signals from the mobile during a specific period, determining the instantaneous power of the received signal on a logarithmic scale, and performing harmonic decomposition to estimate the angular misalignment.

Career Highlights

Francois Varieras is currently associated with Safran Data Systems, where he applies his expertise in antenna technology. His work focuses on enhancing the accuracy and efficiency of radio communication systems.

Collaborations

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Conclusion

Francois Varieras is a notable inventor whose work in antenna technology has the potential to improve radio communication systems significantly. His innovative patent reflects his dedication to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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