CA

Francois Martin

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Institut National D'optique. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Francois Martin. Retrieved from https://idiyas.com/inventor/francois-martin-xlu2cuk3

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2024

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovations of Francois Martin

Introduction

Francois Martin is a notable inventor based in California, recognized for his contributions to optical technology. His work primarily focuses on developing advanced systems for analyzing three-dimensional surfaces. With a keen interest in precision measurement, Martin has made significant strides in the field of optical profilometry.

Latest Patents

Francois Martin holds a patent for a triangulation-based optical profilometry system. This innovative system is designed for scanning three-dimensional sample surfaces located at a sample plane. It includes a projection system, an image sensor, a processing unit, and an objective lens assembly. The system captures a luminous line formed on the sample plane, utilizing a diaphragm that defines a non-circular aperture. This design allows for enhanced imaging capabilities, making it a valuable tool in various applications.

Career Highlights

Martin is affiliated with the Institut National d'Optique, where he has contributed to numerous projects aimed at advancing optical technologies. His expertise in triangulation-based systems has positioned him as a leader in the field. With a focus on innovation, he continues to explore new methodologies for improving optical measurements.

Conclusion

Francois Martin's work exemplifies the intersection of technology and innovation in optical profilometry. His patented system showcases his commitment to enhancing measurement techniques, making a lasting impact in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…