This inventor holds 2 USPTO granted patents. Top assignee: Other. Active years: 2002.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2002
Title: Innovations by Francois Le Poutre
Introduction
Francois Le Poutre is an accomplished inventor based in Janvry, France. He has made significant contributions to the field of thermal imaging, particularly in the inspection of materials. With a total of 2 patents, his work focuses on enhancing the efficiency and accuracy of thermographic inspections.
Latest Patents
Francois Le Poutre's latest patents include a "Method and device for the inspection of a material by thermal imaging." This invention involves a heating zone and a detection zone at the surface of a part, which are displaced to scan the surface effectively. The method allows for the detection of radiated flux using a line of detectors chosen from a matrix, significantly reducing the scanning time and enabling adjustments in the offset between the heating and detection zones. His second patent, "Method for the inspection of a part by thermal imaging," describes a process where heat is imparted to a heating zone on the surface of a part. This method utilizes a detector to sense the radiated flux, allowing for a detailed inspection along a determined path.
Career Highlights
Throughout his career, Francois has focused on developing innovative solutions for thermal imaging applications. His patents reflect a deep understanding of material inspection and the need for efficient methodologies in this field.
Collaborations
Francois has collaborated with notable coworkers, including Laurent Legrandjacques and Christophe F Dehan. Their combined expertise has contributed to the advancement of thermal imaging technologies.
Conclusion
Francois Le Poutre's contributions to thermal imaging and material inspection demonstrate his innovative spirit and commitment to enhancing industry standards. His patents are a testament to his expertise and the impact of his work in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile