Francis Reilly

Title: The Innovative Contributions of Francis Reilly

Introduction

Francis Reilly is a notable inventor based in Bayport, NY (US), recognized for his significant contributions to the field of X-ray metrology. With a total of two patents to his name, Reilly has developed innovative solutions that enhance the functionality and efficiency of measurement tools used in high-temperature environments.

Latest Patents

Reilly's latest patents include a thermal shield system for high-temperature environment XRF metrology tools and a vacuum interface assembly. The thermal shield is designed to protect the X-ray head assembly, which includes the X-ray generation and detection columns, as well as the head control electronics, communications, and cooling systems. This heat shield is strategically positioned below the X-ray head and is made from machined copper, featuring several ports that allow for the passage of primary beam X-rays and the return of fluoresced X-rays from the PV substrate. The vacuum interface assembly is an integral part of an X-ray metrology system for a vacuum deposition chamber. It consists of a housing with an X-ray port that facilitates the passage of X-rays generated by the machine and those fluorescing off a substrate within the chamber.

Career Highlights

Reilly is currently employed at Ceres Technologies, Inc., where he continues to push the boundaries of innovation in X-ray metrology. His work has been instrumental in developing technologies that improve measurement accuracy and reliability in various applications.

Collaborations

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Conclusion

Francis Reilly's contributions to the field of X-ray metrology through his innovative patents demonstrate his commitment to advancing technology. His work at Ceres Technologies, Inc. continues to impact the industry positively.