This inventor holds 1 USPTO granted patent and 7 published patent applications. Top assignee: Compertum Microsystems Inc.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Innovations by Francis Piu Man
Introduction
Francis Piu Man is an accomplished inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of technology, particularly in image capturing and depth measurement. His innovative approach has led to the development of a unique patent that enhances the efficiency of these processes.
Latest Patents
Francis Piu Man holds a patent for a "Color depth integration method, receiver, and light detection and ranging apparatus thereof." This invention integrates image capturing with 3D depth measuring efficiently. The patent describes a receiver that includes at least one detector macro-cell. Each macro-cell consists of a first detector designed to capture reflected light and a second detector for capturing first external light. The arrangement of these detectors in an array constitutes one detector macro-cell. The reflected light represents light emitted from a transmitter and reflected by at least one object. Notably, the frequency range of the first external light and the frequency range of the reflected light is non-overlapping or at least partially non-overlapping.
Career Highlights
Francis Piu Man is associated with Compertum Microsystems Inc., where he continues to innovate and develop advanced technologies. His work focuses on enhancing the capabilities of light detection and ranging systems, which are crucial in various applications, including autonomous vehicles and robotics.
Collaborations
Due to space constraints, the details of collaborations will not be included.
Conclusion
Francis Piu Man's contributions to the field of technology through his innovative patent demonstrate his commitment to advancing image capturing and depth measurement techniques. His work at Compertum Microsystems Inc. continues to pave the way for future advancements in this area.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile