Syracuse, NY, United States of America

Francis M Wampler, Iii

This inventor holds 1 USPTO granted patent. Top assignee: Leybold Inficon, Inc.. Active years: 1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Francis M Wampler, Iii. Retrieved from https://idiyas.com/inventor/francis-m-wampler-iii

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 119(Granted Patents)


Company Filing History:


Years Active: 1997

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1 patent (USPTO):Explore Patents

Title: Innovations by Francis M Wampler, III

Introduction

Francis M Wampler, III is an accomplished inventor based in Syracuse, NY. He has made significant contributions to the field of fluid analysis through his innovative designs. His work focuses on enhancing the efficiency and accuracy of mass spectrometry.

Latest Patents

Wampler holds a patent for a "Composite membrane and support assembly." This invention is designed for treating fluid samples before they are introduced to a mass spectrometer or other appropriate uses. The composite membrane and support assembly allows analytes from a sample flow to permeate through a membrane free from the undesired background matrix. The assembly consists of a semipermeable membrane, a fiber member for supporting the membrane, and a rigid perforated member for additional support.

Career Highlights

Wampler is currently associated with Leybold Inficon, Inc., where he continues to develop innovative solutions in the field of mass spectrometry. His expertise and dedication to research have positioned him as a valuable asset in his company.

Conclusion

Francis M Wampler, III exemplifies the spirit of innovation through his contributions to fluid analysis technology. His patent and ongoing work at Leybold Inficon, Inc. highlight his commitment to advancing scientific research and applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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