This inventor holds 1 USPTO granted patent. Top assignee: The United States of America as Represented by the Administrator of the. Active years: 1984.
Company Filing History:
Years Active: 1984
Title: The Innovative Contributions of Francis E. Marshall
Introduction
Francis E. Marshall is a notable inventor based in Lanham, MD (US). He has made significant contributions to the field of imaging technology, particularly through his innovative patent in X-ray spectrometry. His work has implications for various applications in medical imaging and materials analysis.
Latest Patents
Marshall holds a patent for an "Imaging X-ray spectrometer." This invention provides imaging and energy resolution of an X-ray source. It consists of a thick silicon wafer with an embedded matrix of aluminum, which defines the walls of a rectangular array of silicon X-ray detector cells. The design allows for effective collection of charge carriers generated by incident X-ray energy, facilitating high-quality imaging.
Career Highlights
Throughout his career, Marshall has been associated with the United States of America as Represented by the Administrator of the. His work has been instrumental in advancing the capabilities of X-ray imaging technologies. He has demonstrated a commitment to innovation and excellence in his field.
Collaborations
Marshall has collaborated with notable colleagues, including John W. Jackson, Jr. and Patrick A. Grant. These partnerships have contributed to the development and refinement of his inventions.
Conclusion
Francis E. Marshall's contributions to the field of imaging technology through his patent for an X-ray spectrometer highlight his innovative spirit and dedication to advancing scientific knowledge. His work continues to influence the landscape of imaging applications.