Location History:
- LaGrange, IL (US) (1976)
- La Grange Park, IL (US) (1976 - 1987)
Company Filing History:
Years Active: 1976-1987
Title: The Innovative Contributions of Francis E. Ferrari
Introduction
Francis E. Ferrari is a notable inventor based in La Grange Park, Illinois. He has made significant contributions to the field of pattern tracing technology, holding a total of five patents. His work has advanced the capabilities of electrically controlled pattern tracers, enhancing their efficiency and accuracy.
Latest Patents
Among his latest patents is the "Pattern tracer with kerf dependent control for improved cornering." This invention utilizes stored detected pattern information from a sensor to control the tracing element based on the kerf value entered. It distinguishes between different types of pattern turns and adjusts the use of stored information accordingly. Another significant patent is the "Pattern tracer with variable effective forward offset and method." This invention optimizes the movement of a tracing element along a pattern by controlling the effective forward offset, which is selectively less than the actual forward offset. This allows for improved tracing at speeds below the maximum tracer speed, ensuring that changes in effective forward offset do not affect the lateral offset.
Career Highlights
Francis E. Ferrari has worked at Stewart Warner Corporation, where he has applied his innovative ideas to develop advanced pattern tracing technologies. His contributions have been instrumental in enhancing the performance of various tracing applications.
Collaborations
Throughout his career, Ferrari has collaborated with notable colleagues, including Frans Brouwer and John W. Grant. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies in the field.
Conclusion
Francis E. Ferrari's work exemplifies the spirit of innovation in the realm of pattern tracing technology. His patents reflect a deep understanding of the complexities involved in tracing applications, and his contributions continue to influence the industry.