The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 1986
Filed:
Sep. 30, 1982
John W Grant, River Forest, IL (US);
Francis E Ferrari, LaGrange Park, IL (US);
Stewart-Warner Corporation, Chicago, IL (US);
Abstract
A pattern tracer and method of tracing in which the movement of a racing element along a pattern is controlled in accordance with an effective forward offset which is selectively less than the actual forward offset to optimize the tracing for speeds less than the maximum tracer speed. The effective forward offset is established by providing control angles which are based on the pattern angles as detected in accordance with a selected criterion depending upon the type of pattern curve detected. The control angles are either calculated from the detected pattern angles or are selected from previously stored pattern angles. A kerf setting for lateral offset of the tracing element from the pattern is partially defined by the actual forward offset, so that changes in the effective forward offset do not cause any corresponding changes to the lateral offset or require changes to the kerf setting.