Bordon, United Kingdom

Francis Baldwin

This inventor holds 1 USPTO granted patent. Top assignee: Varex Imaging Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Francis Baldwin. Retrieved from https://idiyas.com/inventor/francis-baldwin-21vrw0z1

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Innovations of Francis Baldwin in Article Scanning Technology

Introduction

Francis Baldwin is an accomplished inventor based in Bordon, GB. He has made significant contributions to the field of article scanning technology. His innovative approach has led to the development of a unique patent that enhances the efficiency of scanning systems.

Latest Patents

Baldwin holds a patent for an "Article scanning system comprising a boom apparatus." This invention features a primary upright section that can be mounted on a vehicle, along with a lateral section made up of movably connected portions. Additionally, it includes a secondary upright section and a radiation detector designed to detect radiation emitted by a radiation emitter. The boom apparatus can be configured in two arrangements: a deployed configuration for scanning articles and a stowed configuration for compact storage.

Career Highlights

Francis Baldwin is associated with Varex Imaging Corporation, where he applies his expertise in imaging technology. His work focuses on developing advanced systems that improve the scanning process, making it more efficient and effective.

Conclusion

Francis Baldwin's contributions to article scanning technology through his innovative patent demonstrate his commitment to advancing the field. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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