San Jose, CA, United States of America

Fnu Pankaj Kumar

This inventor holds 1 USPTO granted patent. Top assignee: Ivanti, Inc.. Active years: 2026.


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Fnu Pankaj Kumar: Innovator in Application Integrity Verification

Introduction

Fnu Pankaj Kumar is a notable inventor based in San Jose, CA. He has made significant contributions to the field of application integrity verification. His innovative approach addresses critical security concerns in software applications.

Latest Patents

Fnu Pankaj Kumar holds a patent for a method of application integrity verification and remediation. This method involves scanning an appliance to identify installed program files associated with an application under analysis. It includes computing a hash value of the installed files and determining their integrity against vendor program files. If discrepancies are found, the method classifies the compromised files and initiates remediation at the network appliance. This patent showcases his expertise in enhancing application security.

Career Highlights

Fnu Pankaj Kumar is currently employed at Ivanti, Inc., where he continues to develop innovative solutions in application security. His work focuses on ensuring the integrity of software applications, which is crucial in today's digital landscape. His contributions have been instrumental in advancing the security measures employed by organizations.

Collaborations

Fnu has collaborated with talented professionals such as Sarat Chandra Chowdary Kongara and Nagesh Ayyagari. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Fnu Pankaj Kumar is a distinguished inventor whose work in application integrity verification has made a significant impact on software security. His innovative methods and collaborations continue to shape the future of application security.

Profile summary based on public USPTO records.
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