Miramar, FL, United States of America

Fiona Wong

This inventor holds 1 USPTO granted patent. Top assignee: American Learning Systems, Inc.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fiona Wong. Retrieved from https://idiyas.com/inventor/fiona-wong-u7ozcnt3

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 16.0

ph-index = 1

Forward Citations = 19(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Fiona Wong: Innovator in Blade Sharpening Technology

Introduction

Fiona Wong is a talented inventor based in Miramar, FL (US). She has made significant contributions to the field of blade sharpening technology. With a focus on innovation, Fiona has developed a unique product that enhances the efficiency of blade maintenance.

Latest Patents

Fiona holds a patent for a blade sharpener housing. This invention showcases her ability to create practical solutions that address common challenges in blade care. Her patent is a testament to her ingenuity and commitment to improving everyday tools.

Career Highlights

Fiona Wong is currently employed at American Learning Systems, Inc. Her role at the company allows her to apply her inventive skills in a collaborative environment. With her background in engineering and design, she has been able to contribute to various projects that enhance product functionality.

Collaborations

Fiona has worked alongside talented colleagues such as Franco Lodato and Massimo Salafia. Their teamwork has fostered a creative atmosphere that encourages innovation and the development of new ideas.

Conclusion

Fiona Wong is a remarkable inventor whose work in blade sharpening technology exemplifies her dedication to innovation. Her contributions not only improve the functionality of tools but also inspire future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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