Murcia, Spain

Fernando Vargas


Average Co-Inventor Count = 9.0

ph-index = 2

Forward Citations = 371(Granted Patents)


Company Filing History:


Years Active: 2001-2004

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2 patents (USPTO):Explore Patents

Title: Innovations by Fernando Vargas in Eye Measurement Technology

Introduction

Fernando Vargas is an accomplished inventor based in Murcia, Spain. He has made significant contributions to the field of optical measurement, particularly in the area of eye wave aberration. With a total of 2 patents, Vargas has developed innovative techniques that enhance the accuracy of eye measurements.

Latest Patents

One of Vargas's notable patents is focused on the rapid and automatic measurement of the eye's wave aberration. This invention allows for real-time determination of wavefront aberrations in the eye. The process involves illuminating the eye and capturing the light reflected from the retina, which is then converted into spots using a Hartmann-Shack detector. By analyzing the displacement of these spots, Vargas's method calculates the aberration effectively. The technique employs an iterative approach to locate centroids within the image data, refining the measurement through smaller boxes around the centroids. Additionally, the wavefront aberration is computed using a matrix that can eliminate unusable data, ensuring accuracy across different pupil sizes through renormalization.

Career Highlights

Fernando Vargas is affiliated with the University of Rochester, where he continues to advance research in optical technologies. His work has garnered attention for its practical applications in improving vision correction methods.

Collaborations

Vargas collaborates with esteemed colleagues such as David R. Williams and William J. Vaughn, contributing to a dynamic research environment that fosters innovation in eye measurement technologies.

Conclusion

Fernando Vargas's contributions to the field of eye measurement through his innovative patents demonstrate his commitment to advancing optical science. His work not only enhances the understanding of wave aberrations but also paves the way for improved vision correction techniques.

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