Lake Forest, CA, United States of America

Fernando Valenzuela

This inventor holds 1 USPTO granted patent and 4 published patent applications and 2 EPO patents. Top assignee: Nanovea, Inc.. Active years: 2019.

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Innovations of Fernando Valenzuela

Introduction

Fernando Valenzuela is an accomplished inventor based in Lake Forest, CA (US). He holds a patent for a groundbreaking device that enhances the measurement of surface profiles using advanced optical technology. His work has significant implications in various fields, including materials science and engineering.

Latest Patents

Valenzuela's notable patent is for a "3D Surface Scanning White Light Axial Chromatism Device." This innovative system measures a specimen's surface profile by passing a bright white light source through a series of lenses. These lenses generate repeatable chromatic focal shift variations of wavelengths of white light for Z-axis measurements. The device's sensor moves along an X-Y raster pattern, controlled by X-directional and Y-directional scanners in combination with X and Y actuators. The system translates chromatic focal shifts into digital data, which can be used to control the position of the lenses along the specimen's surface and generate 3D topographical images.

Career Highlights

Valenzuela is currently associated with Nanovea, Inc., where he continues to develop and refine his innovative technologies. His contributions to the field of optical measurement have positioned him as a key figure in advancing surface profiling techniques.

Collaborations

He has worked alongside talented colleagues such as Pierre Leroux and Curt Deckert, contributing to a collaborative environment that fosters innovation and creativity.

Conclusion

Fernando Valenzuela's work exemplifies the spirit of innovation in the field of optical measurement technology. His patented device represents a significant advancement in the ability to analyze and visualize surface profiles, showcasing the potential for future developments in this area.

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