Lynnwood, WA, United States of America

Fernando Dias Pauer

This inventor holds 1 USPTO granted patent. Top assignee: Amazon Technologies, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fernando Dias Pauer. Retrieved from https://idiyas.com/inventor/fernando-dias-pauer-5u5htz3i

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Fernando Dias Pauer and IoT Event Detector Verification.

Introduction

Fernando Dias Pauer is an inventor based in Lynnwood, Washington. His patent work addresses the reliability of Internet of Things (IoT) event detector models before they are deployed at scale.

Latest Patents

Pauer is associated with 1 patent: “System and Methods for IoT Event Detector Correctness Verification.” The invention describes a correctness checker that analyzes a representation of an event detector model’s definition. These models can use variables, states, transitions, and actions to interpret IoT device data and detect events that trigger actions.

The checker evaluates whether the model complies with specified correctness properties and generates a report describing the results. One example is reachability: whether particular states or actions can be reached according to the model’s definition. The analysis can be accessed through an interface and may identify where a model definition fails to comply.

Career Highlights

Pauer is associated with Amazon Technologies, Inc. His patent reflects work on verifying event-detection logic, helping identify potential model issues before deployment.

Collaborations

Andrew Jude Gacek is identified as Pauer’s coworker. The available information does not specify their roles or describe a particular joint project.

Conclusion

Fernando Dias Pauer’s patent focuses on checking IoT event detector models for correctness and reporting potential issues before those models are deployed at scale.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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