Guangzhou, China

Fengshi Cai

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Guangzhou Diligine Photonics Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fengshi Cai. Retrieved from https://idiyas.com/inventor/fengshi-cai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Fengshi Cai and Galvanometer Adjustment Technology.

Introduction

Fengshi Cai is an inventor based in Guangzhou, China. His patent work includes a method for adjusting galvanometer swinging in laser-processing systems.

Latest Patents

Cai is associated with 1 patent: “Method for Adjusting Swinging of Galvanometer and Related Devices.” The disclosed method guides a processing laser to a processing surface through a first galvanometer and establishes a correspondence between the surface’s reference coordinates and the galvanometer’s swinging-angle ranges. It divides the surface into calibration regions, identifies swinging-angle coordinates for target points in selected regions, and establishes a corresponding relationship for a second galvanometer. These steps support calibration of galvanometer movement for laser processing.

Career Highlights

Cai is associated with Guangzhou Diligine Photonics Co., Ltd. His patent focuses on coordinating reference positions on a laser-processing surface with galvanometer angles, a technical approach relevant to accurate laser positioning.

Collaborations

Cai’s listed coworker is Tianxiang Bai. The available information does not specify their particular roles or contributions to the patent.

Conclusion

Fengshi Cai’s patent describes a calibration method for relating laser-processing coordinates to galvanometer movement, reflecting his work in laser-processing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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