Company Filing History:
Years Active: 2022-2024
Title: Innovations of Fengju Sun in Length Measurement Technology
Introduction
Fengju Sun is a notable inventor based in Beijing, China. He has made significant contributions to the field of metrology and measurement technology, particularly in the measurement of conical workpieces. With a total of three patents to his name, his work showcases innovative methods and devices that enhance measurement accuracy.
Latest Patents
Fengju Sun's latest patents include a "Length measurement method for conical workpiece based on dual displacement sensors." This method utilizes two laser displacement sensors symmetrically arranged to measure the length of a conical workpiece accurately. The sensors are calibrated to determine the distance from each sensor to the bottom plane of the workpiece. The total length is calculated using a specific formula that accounts for various factors influencing measurement accuracy.
Another significant patent is the "Device for measuring length and center of mass of conical workpiece." This device comprises an inner frame, an outer frame, a base plate, and laser displacement sensors. It is designed to measure both the length and the center of mass of a conical workpiece, ensuring precise measurements through its innovative design.
Career Highlights
Fengju Sun is affiliated with the Beijing Aerospace Institute for Metrology and Measurement Technology. His work at this institute has allowed him to focus on developing advanced measurement technologies that are crucial for various applications in aerospace and engineering.
Collaborations
Fengju Sun collaborates with talented coworkers, including Xiaosan Wang and Lei Yan. Their combined expertise contributes to the innovative projects undertaken at the institute, fostering a collaborative environment that enhances research and development.
Conclusion
Fengju Sun's contributions to measurement technology, particularly in the context of conical workpieces, demonstrate his innovative spirit and dedication to advancing the field. His patents reflect a commitment to improving measurement accuracy and efficiency, making a significant impact in metrology.