Xi'an, China

Fengfeng Hu

This inventor holds 1 USPTO granted patent. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fengfeng Hu. Retrieved from https://idiyas.com/inventor/fengfeng-hu-6zxlyzzx

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations of Fengfeng Hu in 3D Imaging Technology.

Introduction

Fengfeng Hu is a notable inventor based in Xi'an, China. He has made significant contributions to the field of 3D imaging technology. His innovative work focuses on enhancing the precision and robustness of imaging systems.

Latest Patents

Fengfeng Hu holds a patent for a "Metasurface-based structured light 3D imaging system and method." This invention utilizes a metasurface-based control device to achieve high-quality control of a laser beam. It employs a MEMS micromirror to scan and project the laser beam, enabling high-precision reconstruction of 3D information from the surface of an object. The invention also includes related structured light design and demodulation methods. It realizes fine control of structured light, improves the quality of the structured light field, reduces laser speckles, and enhances power, thereby improving 3D imaging precision and robustness. He has 1 patent to his name.

Career Highlights

Fengfeng Hu's career is marked by his dedication to advancing imaging technologies. His innovative approaches have garnered attention in the scientific community. His work has the potential to impact various applications in 3D imaging.

Collaborations

Fengfeng Hu has collaborated with notable colleagues, including Tao Yang and Minyu Bai. Their joint efforts have contributed to the development of advanced imaging systems.

Conclusion

Fengfeng Hu's contributions to 3D imaging technology exemplify the importance of innovation in enhancing imaging precision and robustness. His work continues to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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