Auburn, AL, United States of America

Feng Li

This inventor holds 2 USPTO granted patents. Top assignee: Auburn University. Active years: 2021-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Feng Li. Retrieved from https://idiyas.com/inventor/feng-li-j0f1bgwt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2021-2024

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2 patents (USPTO):Explore Patents

Title: Innovations of Inventor Feng Li

Introduction

Feng Li is a notable inventor based in Auburn, Alabama, known for his contributions to the field of nanotechnology. He has been instrumental in developing methods that enhance the application of nanoparticle complexes in medical treatments.

Latest Patents

Feng Li holds 2 patents, with his latest inventions focusing on the preparation of stabilized metal ion ligand nanocomplexes. The first patent details a method for creating a nanoparticle complex that includes a ligand and a metal cation. This disclosure also outlines various applications of these nanoparticle complexes, including methods for treating diseases in patients and identifying diseases using these complexes.

Career Highlights

Feng Li is affiliated with Auburn University, where he continues to advance research in nanotechnology. His work has significant implications for medical science, particularly in the development of innovative treatment methods.

Collaborations

Feng Li has collaborated with notable colleagues, including Wu Chen and Pengyu Chen, contributing to a dynamic research environment that fosters innovation.

Conclusion

Feng Li's work exemplifies the intersection of technology and medicine, showcasing the potential of nanoparticle complexes in improving healthcare outcomes. His contributions to the field are invaluable and continue to inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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