Shenzhen, China

Feng Ji

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Xi'an Zhongxing New Software Co., Ltd.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Feng Ji. Retrieved from https://idiyas.com/inventor/feng-ji-0urv0h36

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Feng Ji: Inventor of an Operation and Maintenance System

Introduction

Feng Ji is an inventor based in Shenzhen, China. His patent work focuses on operation and maintenance systems and methods, including automated processes for managing data, identifying faults, and checking results. He is associated with 1 patent.

Latest Patents

Feng Ji’s patent, “Operation and Maintenance System and Method,” describes a system made up of interconnected modules. These include modules for data acquisition and storage, exception and fault labeling, automatic model training and assessment, operation and maintenance management and task execution, and result checking. Together, the modules support an integrated approach to operational monitoring and maintenance.

Career Highlights

Feng Ji has been associated with Xi’an Zhongxing New Software Co., Ltd. and ZTE Corporation. His patent reflects work on combining data handling, model assessment, and task execution within an operation and maintenance framework.

Collaborations

Feng Ji’s listed coworkers include Lixia Liu and Tao Wen. Their names are associated with his professional network.

Conclusion

Feng Ji’s patent presents an integrated operation and maintenance system that connects data collection, fault identification, model assessment, task execution, and result checking.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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