Jiangsu, China

Feng Feng

This inventor holds 1 USPTO granted patent. Top assignee: Jiangsu University of Science and Technology. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Feng Feng. Retrieved from https://idiyas.com/inventor/feng-feng-gwckbsr7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 10.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Feng Feng

Introduction

Feng Feng is a notable inventor based in Jiangsu, China. He has made significant contributions to the field of engineering, particularly in the area of non-contact detection methods for shaft workpieces. His innovative approach has the potential to enhance precision in manufacturing processes.

Latest Patents

Feng Feng holds a patent for an "in-place non-contact detection method for shaft workpiece." This invention outlines a systematic approach that includes establishing a detection system, calibrating it, and analyzing the pose of a workpiece. The method utilizes a linear laser measuring instrument to continuously acquire data, ultimately calculating the ideal reference axis of the shaft workpiece. This process also assesses the machining precision of runout and coaxiality of the shaft workpiece.

Career Highlights

Feng Feng is affiliated with Jiangsu University of Science and Technology, where he contributes to research and development in engineering. His work is characterized by a commitment to advancing detection technologies that improve manufacturing accuracy.

Collaborations

Feng has collaborated with esteemed colleagues such as Guochao Li and Honggen Zhou. Their combined expertise fosters a productive research environment that drives innovation in their field.

Conclusion

Feng Feng's contributions to the field of engineering through his innovative patent demonstrate his commitment to enhancing manufacturing processes. His work not only reflects his expertise but also paves the way for future advancements in non-contact detection methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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