Gush Segev, Israel

Felix Cohen

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2002.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:

goldMedal1 out of 834,453 
Other
 patents

Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Felix Cohen - Innovator in Wafer Cutting Technology

Introduction

Felix Cohen is a notable inventor based in Gush Segev, Israel. He has made significant contributions to the field of wafer cutting technology. His innovative approach has led to the development of a unique method that enhances efficiency in the manufacturing process.

Latest Patents

Felix Cohen holds 1 patent for his invention titled "Workpiece cutting method for use with dicing machine." This patent describes a method where two blades are arranged oppositely at a predetermined interval along the Y-axis. The two blades cut a wafer along two cutting lines simultaneously while moving along the X-axis. After the wafer is cut along these two lines, the blades are moved along the Y-axis by one pitch of the cutting lines, allowing for continuous cutting of the wafer. This innovative method minimizes the movement of the blades along the X-axis, resulting in a faster cutting process.

Career Highlights

Throughout his career, Felix has demonstrated a commitment to advancing technology in the semiconductor industry. His work has not only improved efficiency but also contributed to the overall quality of wafer cutting processes.

Collaborations

Felix Cohen has collaborated with talented individuals in his field, including Hirofumi Shimoda and Masayuki Azuma. These collaborations have fostered innovation and have been instrumental in the development of his patented technology.

Conclusion

Felix Cohen's contributions to wafer cutting technology exemplify the spirit of innovation. His patented method showcases his ability to enhance manufacturing processes, making him a significant figure in the industry.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
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