New York, NY, United States of America

Felipe Giraldo Mejia

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Qunnect, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Felipe Giraldo Mejia. Retrieved from https://idiyas.com/inventor/felipe-giraldo-mejia

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Felipe Giraldo Mejia and Photon-Correlation Detection

Introduction

Felipe Giraldo Mejia is an inventor associated with Qunnect, Inc., in New York, NY (US). His patent work addresses detector requirements in quantum entanglement and quantum communication systems that use optical qubits.

Latest Patents

Mejia is associated with 1 patent, titled “System and Method for Detecting Correlations Between Two Photons.” The invention describes using delay lines between beam-splitting optical elements to make photons arrive at a detector at different times. This timing approach allows one shared detector to detect multiple photons for a correlation measurement, reducing the number of required detectors by half and lowering the hardware cost and complexity of systems that detect and process qubits.

Career Highlights

Mejia’s patent reflects an engineering approach to simplifying photon-detection systems. By coordinating photon arrival times, the disclosed method aims to reduce detector requirements while supporting measurements used in quantum communication and entanglement research.

Collaborations

Mejia is associated with Qunnect, Inc. His listed coworkers include Alexander Craddock and Mael Flament.

Conclusion

Felipe Giraldo Mejia’s patented photon-detection method uses timing and shared hardware to reduce the detector count and complexity of systems for quantum measurements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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