Xi'an, China

Feifei Yin

This inventor holds 1 USPTO granted patent. Top assignee: Huawei Technologies Co., Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Feifei Yin. Retrieved from https://idiyas.com/inventor/feifei-yin-xs8tgt58

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Feifei Yin: Inventor of a Terminal Chip Measurement Method.

Introduction

Feifei Yin is an inventor associated with Xi’an, China, and Huawei Technologies Co., Ltd. The available information identifies her as a woman and credits her with 1 patent.

Latest Patents

Yin is named on the patent “Terminal Chip and Measurement Method Thereof.” The disclosure describes a terminal chip with a computing subsystem and a security subsystem, with the security subsystem starting before the computing subsystem. An integrity verification unit in the security subsystem measures data during the computing subsystem’s boot process.

Career Highlights

Yin’s listed patent concerns security and integrity measurement during device startup. The available details associate her work with Huawei Technologies Co., Ltd.

Collaborations

Yin’s listed coworkers include Jianwei Jia and Gang Feng.

Conclusion

Feifei Yin’s recorded invention addresses how a terminal chip can verify the integrity of computing-subsystem data during startup.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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