This inventor holds 1 USPTO granted patent. Top assignee: Huawei Technologies Co., Limited. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Feifei Yin: Inventor of a Terminal Chip Measurement Method.
Introduction
Feifei Yin is an inventor associated with Xi’an, China, and Huawei Technologies Co., Ltd. The available information identifies her as a woman and credits her with 1 patent.
Latest Patents
Yin is named on the patent “Terminal Chip and Measurement Method Thereof.” The disclosure describes a terminal chip with a computing subsystem and a security subsystem, with the security subsystem starting before the computing subsystem. An integrity verification unit in the security subsystem measures data during the computing subsystem’s boot process.
Career Highlights
Yin’s listed patent concerns security and integrity measurement during device startup. The available details associate her work with Huawei Technologies Co., Ltd.
Collaborations
Yin’s listed coworkers include Jianwei Jia and Gang Feng.
Conclusion
Feifei Yin’s recorded invention addresses how a terminal chip can verify the integrity of computing-subsystem data during startup.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
