Fei Yuan

Title: Fei Yuan: Innovator in Defect Analysis Technologies

Introduction

Fei Yuan is a prominent inventor based in Beijing, China, known for his contributions to defect analysis technologies. With a total of 5 patents to his name, Yuan has made significant strides in the field of computer-implemented methods for evaluating defects in device operations.

Latest Patents

Yuan's latest patents include a range of innovative technologies aimed at improving defect analysis. These patents consist of a computer-implemented method for defect analysis, a computer-implemented method of evaluating the likelihood of defect occurrence, an apparatus for defect analysis, a computer-program product, and an intelligent defect analysis system. The computer-implemented method for defect analysis involves calculating a plurality of weight-of-evidence (WOE) scores for various device operations concerning defects that occurred during a fabrication period. A higher WOE score indicates a stronger correlation between a defect and a device operation. The method also ranks these WOE scores to create a list of device operations that are highly correlated with defects, focusing on those with scores exceeding a specified threshold.

Career Highlights

Throughout his career, Fei Yuan has worked with notable companies, including BOE Technology Group Co., Ltd. and Telefonaktiebolaget Lm Ericsson (publ). His experience in these organizations has allowed him to develop and refine his expertise in defect analysis technologies.

Collaborations

Yuan has collaborated with several professionals in his field, including Haohan Wu and Dong Chai. These collaborations have contributed to the advancement of his research and innovations.

Conclusion

Fei Yuan's work in defect analysis technologies showcases his innovative spirit and dedication to improving device operations. His contributions have the potential to significantly impact the industry, making him a noteworthy figure in the realm of inventions.