Boe Technology Group Co., Ltd.

Telefonaktiebolaget Lm Ericsson (publ)

Fei Yuan

Haohan Wu

Dong Chai

Tian Lan

Yue Tang

Guoliang Shen

Hong Wang

Qiang Li

Wenwen Sun

Jianmin Wu

Suo Zhang

Xuefeng Kan

Jianzhou Wang

Tingting Fu

Guanchun Bai

Junxin Zhao

Yingli Zeng

A computer-implemented method for defect analysis is provided. The computer-implemented method includes calculating a plurality of weight-of-evidence (WOE) scores respectively for a plurality of device operations with respect to defects occurred during a fabrication period, a higher WOE score indicating a higher correlation between a defect and a device operation; and ranking the plurality of WOE scores to obtain a list of selected device operations highly correlated with the defects occurred during the fabrication period, device operations in the list of selected device operations having a WOE score greater than a first threshold score. A respective one of the plurality of device operations is a respective device defined by a respective operation site at which the respective device perform a respective operation.

Computer-implemented method for defect analysis, computer-implemented method of evaluating likelihood of defect occurrence, apparatus for defect analysis, computer-program product, and intelligent defect analysis system

A computer-implemented method for defect analysis is provided. The computer-implemented method includes calculating a plurality of weight-of-evidence (WOE) scores respectively for a plurality of device operations with respect to detects occurred during a fabrication period, a higher WOE score indicating a higher correlation between a defect and a device operation; and ranking the plurality of WOE scores to obtain a list of selected device operations highly correlated with the defects occurred during the fabrication period, device operations in the list of selected device operations having a WOE score greater than a first threshold score. A respective one of the plurality of device operations is a respective device defined by a respective operation site at which the respective device perform a respective operation.

A data management platform for intelligently managing data is provided. The data management platform includes an ETL module configured to extract, cleanse, transform, or load data; a data lake configured to store a first group of data formed by extracting raw data from a plurality of data sources by the ETL module; a data warehouse configured to store a second group of data formed by cleansing and standardizing on the first group of data; a general data layer configured to store a third group of data formed by subjecting the second group of data to data fusion; and a data mart configured to store a fourth group of data formed by transforming the third group of data by the ETL module. The general data layer is a distributed data storage storing information available for querying. The data mart is a database of NoSQL type storing information available for computational processing.

Data management platform, intelligent defect analysis system, intelligent defect analysis method, computer-program product, and method for defect analysis

The present disclosure provides an electronic device, a method for generating a package drawing, and a computer readable storage medium. The electronic device includes a display device and a processor, the processor is configured to obtain a type of the element and size parameters corresponding to the element input by a user; determine a size and a position of each of pads corresponding to the element according to the type of the element and the size parameters corresponding to the element, and draw the pads; determine coordinates of endpoints of an entity layer corresponding to the element, and draw the entity layer; determine coordinates of endpoints of a height layer corresponding to the element, and draw the height layer; and determine coordinates of endpoints of a screen layer corresponding to the element, and draw the screen layer.

Electronic device, method for generating package drawing and computer readable storage medium

The present invention discloses an apparatus for detecting a faulty antenna among a plurality of antennas contained in a communication device (), comprising: a measurer () adapted to measure signal strengths of signals obtained from the plurality of antennas each; a calculator () adapted to calculate differences between each two of the measured signal strengths; a first comparator () adapted to compare each of the calculated differences with a first predetermined threshold value; and a first decider () adapted to decide, among the plurality of antennas, an antenna to be faulty on the basis of a respective result of the comparison. The present invention provides an efficient and direct way to detect antennas that are not performing according to expectations, without use of extra external or dedicated detection devices, which reduces hardware and software cost. Further, the detection performed according to the present invention only takes advantage of the measured data of signal strengths, and neither extra transmit power nor time slot is needed for the detection. Also, statistical data of antennas for a long term can be obtained according to the present invention.

Apparatus and method for detecting faulty antennas

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Beijing, China

Fei Yuan