Brooklyn, NY, United States of America

Farrell Newton

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Farrell Newton. Retrieved from https://idiyas.com/inventor/farrell-newton

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 286(Granted Patents)


Company Filing History:

goldMedal1 out of 834,601 
Other
 patents

Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: The Innovations of Farrell Newton

Introduction

Farrell Newton is an accomplished inventor based in Brooklyn, NY. He has made significant contributions to the field of user identification and authentication systems. With a focus on enhancing security measures, his work is vital in today's digital landscape.

Latest Patents

Farrell Newton holds a patent for a "User identification and authentication system using ultra long." This innovative method provides user identification and authentication through ultra long identification key codes and/or ultra large databases of identification key codes. It ensures secure access to remote computer terminals and database or server transaction programs stored on host computers.

Career Highlights

Throughout his career, Farrell has demonstrated a commitment to advancing technology in user security. His patent reflects his expertise and dedication to creating solutions that address modern challenges in data protection.

Collaborations

Farrell Newton has worked alongside Gareth F Williams, contributing to the development of innovative technologies in their field.

Conclusion

Farrell Newton's work in user identification and authentication systems showcases his innovative spirit and dedication to enhancing security in technology. His contributions are essential in the ongoing evolution of secure digital access.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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