Farid Askary

Title: Farid Askary: Innovator in Metrology and Imaging Systems

Introduction

Farid Askary is a notable inventor based in Santa Clara, CA, who has made significant contributions to the fields of metrology and imaging systems. With a total of 4 patents to his name, Askary's work focuses on enhancing measurement techniques and improving imaging accuracy.

Latest Patents

One of Askary's latest patents is a method for measurement of pitch in metrology and imaging systems. This invention provides a systematic approach to measuring pitch in data obtained from various instruments. The method involves obtaining a data set, converting it into digital format, and mapping it into a one-dimensional profile. A criteria function is constructed to determine the value of translation, which is reported as the pitch in the data set.

Another significant patent is related to electron beam dose control for scanning electron microscopy and critical dimension measurement instruments. This system and method control electron exposure on image specimens by adjusting the raster scan area between scan frame cycles. The innovation aims to reduce voltage differentials and charge buildup, thereby enhancing the clarity of small features in scanned images.

Career Highlights

Throughout his career, Farid Askary has worked with prominent companies, including Kla-Tencor Corporation. His expertise in metrology and imaging systems has positioned him as a valuable asset in the industry.

Collaborations

Askary has collaborated with notable professionals in his field, including Neil W. Richardson and Stefano E. Concina. These collaborations have contributed to the advancement of technology in metrology and imaging systems.

Conclusion

Farid Askary's innovative contributions to metrology and imaging systems demonstrate his commitment to advancing technology. His patents reflect a deep understanding of measurement techniques and imaging accuracy, making him a significant figure in his field.