Loudonville, NY, United States of America

Farhan Gandhi

This inventor holds 1 USPTO granted patent. Top assignee: Rensselaer Polytechnic Institute. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Farhan Gandhi. Retrieved from https://idiyas.com/inventor/farhan-gandhi-3vld1vx2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Farhan Gandhi and Multicopter Rotor Fault Diagnosis

Introduction

Farhan Gandhi is an inventor associated with Rensselaer Polytechnic Institute in Loudonville, New York. His work includes a patent for a system designed to detect and identify faults in multicopter rotors. His patent portfolio includes 1 patent.

Latest Patents

Gandhi’s patent, “Multicopter Online Rotor Fault Diagnosis System,” describes a system that uses sensors mounted on a multicopter’s booms to measure out-of-plane strain and continuously generate signals. A controller processes those signals with a pattern-recognition algorithm to detect and identify rotor faults simultaneously. The system combines a multicopter body, outward-extending booms, rotors attached to the booms, local sensors, and a controller.

Career Highlights

The patented system focuses on monitoring rotor-related faults through measurements taken directly from the multicopter’s booms. Its continuous sensing and pattern-recognition approach is intended to help identify faults as they occur.

Collaborations

Gandhi’s listed coworkers include Fotios Kopsaftopoulos and Airin Dutta. His association with Rensselaer Polytechnic Institute connects his inventive work with an academic research environment.

Conclusion

Farhan Gandhi’s patent presents an approach to multicopter safety and monitoring by using boom-strain measurements and pattern recognition to identify rotor faults.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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