Sunnyvale, CA, United States of America

Fang Yu

This inventor holds 1 USPTO granted patent and 5 published patent applications. Top assignee: Datavisor, Inc.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fang Yu. Retrieved from https://idiyas.com/inventor/fang-yu-kubq1v2t

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Fang Yu and Fraud Detection Innovation.

Introduction

Fang Yu is an inventor based in Sunnyvale, California, and is associated with Datavisor, Inc. His work includes an invention focused on identifying suspicious accounts through patterns in user-generated content.

Latest Patents

The available information lists 1 patent for Fang Yu: “Detection of Common Patterns in User Generated Content with Applications in Fraud Detection.” The patent describes methods, systems, and computer programs for detecting suspicious accounts. One method identifies potential clusters of malicious accounts, analyzes content associated with each account using multiple models in sequence, and determines whether the content reveals a common pattern. Based on those determinations, the accounts in each cluster are classified as ordinary or suspicious.

Career Highlights

Fang Yu’s listed patent highlights an approach to fraud detection that combines account clustering with sequential analysis of user-generated content. The invention is associated with Datavisor, Inc.

Collaborations

Fang Yu’s listed coworkers include Alexandros Vlissidis and Olivia Wang.

Conclusion

Fang Yu’s patent describes a content-pattern analysis approach for distinguishing suspicious accounts from ordinary ones, reflecting his contribution to fraud-detection innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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