Rocky Hill, CT, United States of America

Fang Li


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2012-2013

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2 patents (USPTO):Explore Patents

Title: The Innovative Mind of Fang Li: Advancements in Stress Measurement Technologies

Introduction

Fang Li, a distinguished inventor based in Rocky Hill, Connecticut, has made significant contributions to the field of materials science through her innovative inventions. With two patents to her name, she is at the forefront of developing advanced tools and methodologies that enhance the understanding of residual stresses in materials, particularly in the context of silicon wafers.

Latest Patents

Fang Li's latest patent, titled "Polariscope Stress Measurement Tool and Method of Use," presents a groundbreaking tool and method that utilizes an infrared transmission technique. This innovation aims to extract the full stress components of in-plane residual stresses found in thin, multi-crystalline silicon wafers. One of the key features of this invention is its capacity for in situ measurement of residual stress in large cast wafers. The shear difference method is employed to obtain comprehensive stress components by integrating the shear stress map derived from the boundaries. Notably, the ambiguity at these boundaries is resolved by introducing a new analytical function. Furthermore, the invention features a new anisotropic stress optic law, along with calibrated stress optic coefficients for different crystal grain orientations and stress orientations.

Career Highlights

Fang Li is associated with the Georgia Tech Research Corporation, where her research and development efforts focus on advancing measurement techniques for materials engineering. Her work not only contributes to scientific advancement but also has practical applications in various industries, particularly those utilizing silicon wafers in their production processes.

Collaborations

Throughout her career, Fang Li has collaborated with prominent colleagues, including Steven Danyluk. Together, they have worked on several projects aimed at enhancing the capabilities and understanding of stress measurement tools, thereby contributing to innovative solutions in their field.

Conclusion

Fang Li's dedication to innovation in the field of stress measurement is evident through her patents and collaborative efforts. As she continues her work at Georgia Tech Research Corporation, her contributions will undoubtedly lead to further advancements in materials science, benefitting both academic research and industrial applications.

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