Shanghai, China

Fang Du

This inventor holds 2 USPTO granted patents. Top assignee: Pateo Connect + Technology (Shanghai) Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fang Du. Retrieved from https://idiyas.com/inventor/fang-du-fejpya41

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Fang Du - Innovator in Vehicle Control Technology

Introduction

Fang Du is a notable inventor based in Shanghai, China. He has made significant contributions to the field of vehicle control technology. His innovative approach has led to the development of a unique method for controlling vehicle equipment.

Latest Patents

Fang Du holds a patent for a "Method for controlling vehicle equipment, electronic equipment, and storage medium." This method involves obtaining direction information of a terminal and a vehicle based on the geomagnetic field. It also includes determining relative position information between the terminal and the vehicle. The invention allows for controlling vehicle equipment through the terminal or displaying information on the terminal.

Career Highlights

Fang Du is currently associated with Pateo Connect + Technology Corporation in Shanghai. His work focuses on enhancing the interaction between vehicles and electronic devices. He has demonstrated a commitment to advancing technology in the automotive sector.

Collaborations

Fang collaborates with Hongren Shi, who is also a key contributor to their projects. Their teamwork has been instrumental in driving innovation within their company.

Conclusion

Fang Du's contributions to vehicle control technology exemplify the spirit of innovation. His patent reflects a forward-thinking approach that could shape the future of automotive technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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