Guangzhou, China

Fang Chen

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Jabil Circuit (Singapore) Pte. Ltd.. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fang Chen. Retrieved from https://idiyas.com/inventor/fang-chen-7fx5eei7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Fang Chen - Innovator in Electrical Testing Devices

Introduction

Fang Chen is a notable inventor based in Guangzhou, China. He has made significant contributions to the field of electrical testing through his innovative designs. His work focuses on enhancing the efficiency and reliability of electrical device testing.

Latest Patents

Fang Chen holds a patent for a "Connecting device for connecting an electrical device under test to a test instrument." This device features a lower modular unit that includes a port substrate and multiple lower connecting terminals. The upper modular unit is designed to be movable, allowing for effective electrical connections with the signal contact portions of the device under test. This innovative design streamlines the testing process and improves accuracy.

Career Highlights

Fang Chen is currently employed at Jabil Circuit (Singapore) Pte. Ltd., where he continues to develop cutting-edge technologies. His work has garnered attention for its practical applications in the industry. With a focus on electrical testing, he has established himself as a key player in the field.

Collaborations

Fang has collaborated with talented individuals such as Shan-Huai Lan and Xiang-Lin Xiang. These partnerships have contributed to the advancement of his projects and the successful implementation of his inventions.

Conclusion

Fang Chen's innovative contributions to electrical testing devices highlight his expertise and commitment to advancing technology. His patent and ongoing work at Jabil Circuit demonstrate his significant impact in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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