Hamburg, Germany

Falko Diebel

This inventor holds 2 USPTO granted patents and 3 published patent applications and 1 EPO patent. Top assignee: Microvision, Inc.. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Falko Diebel. Retrieved from https://idiyas.com/inventor/falko-diebel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025-2026

Loading Chart...
Loading Chart...
2 patents (USPTO):Explore Patents

Title: Falko Diebel - Innovator in Optical Data Processing

Introduction

Falko Diebel is a notable inventor based in Hamburg, Germany. He has made significant contributions to the field of optical data processing, particularly through his innovative methods and devices.

Latest Patents

Falko Diebel holds a patent for a "Method for analyzing backscatter histogram data in an optical pulse runtime method and device for data processing." This patent involves a method that includes the steps of receiving backscatter histogram data and analyzing the received data. He has 1 patent to his name, showcasing his expertise in this specialized area.

Career Highlights

Falko Diebel is currently employed at Microvision, Inc., where he continues to develop and refine his innovative ideas. His work focuses on enhancing optical data processing techniques, which are crucial for various applications in technology and research.

Collaborations

Falko collaborates with Ralf Beuschel, contributing to advancements in their field through shared knowledge and expertise.

Conclusion

Falko Diebel's contributions to optical data processing through his patent and work at Microvision, Inc. highlight his role as an influential inventor in the industry. His innovative methods continue to pave the way for future advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…