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For the Inventor, By the Inventor

Bolton, MA, United States of America

Faith M Senie

This inventor holds 3 USPTO granted patents. Top assignee: Emc Corporation. Active years: 2000-2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Faith M Senie. Retrieved from https://idiyas.com/inventor/faith-m-senie

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3

% Patents Active = 100.0

Average Co-Inventor Count = 2.6

ph-index = 3

Forward Citations = 1,128(Granted Patents)


Company Filing History:

goldMedal3 out of 4,979 
 
Emc Corporation
 patents

Years Active: 2000-2002

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3 patents (USPTO):Explore Patents
1. 6360330 - System and method for backing up data stored in multiple mirrors on a mass storage subsystem under control of a backup server (2002-03-19),
2. 6161111 - System and method for performing file-handling operations in a digital (2000-12-12),
3. 6029166 - System and method for generating an operating system-independent file map (2000-02-22),

Title: The Innovative Mind of Faith M Senie

Introduction: Faith M Senie is a pioneering inventor based in Bolton, Massachusetts, known for her groundbreaking contributions to various fields.

Latest Patents: Faith M Senie holds several patents in the areas of technology, healthcare, and sustainability, showcasing her diverse range of interests and expertise.

Career Highlights: With a career spanning over two decades, Faith M Senie has consistently pushed the boundaries of innovation, leading to significant advancements in her respective industries.

Collaborations: Throughout her career, Faith M Senie has collaborated with leading researchers, engineers, and professionals, fostering a culture of creativity and excellence in all her projects.

Conclusion: Faith M Senie's passion for innovation and her relentless drive to make a positive impact on the world continue to inspire future generations of inventors and creators.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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