Fabrice Baray

Title: Innovations by Inventor Fabrice Baray in Integrated Circuits

Introduction

Fabrice Baray, an influential inventor located in Sunnyvale, California, has made notable advancements in the field of integrated circuits. With a focus on enhancing the reliability and efficiency of these critical electronic components, Baray holds a patent that addresses the frequent challenge of glitch failures in integrated circuits.

Latest Patents

Baray's patent, titled "Methods and Systems for Efficient Identification of Glitch Failures in Integrated Circuits," presents a groundbreaking approach to diagnosing potential failures in ICs caused by glitches. This invention dissects the complex requirements of glitch checking into systematic steps, significantly improving both performance and accuracy in identifying glitch failures prior to manufacturing. His work highlights the need for high performance and precision, achieving 100% recall while minimizing erroneous reports of glitch failures.

Career Highlights

Currently working at Real Intent, Inc., Baray has demonstrated a commitment to advancing technology within the realm of integrated circuits. His innovative methods not only address existing challenges but also set a new standard in the industry for analyzing logic circuits with a high degree of reliability and efficiency.

Collaborations

At Real Intent, Inc., Baray collaborates with esteemed colleagues such as Pranav N Ashar and Hari Mony. This collaborative environment serves to enhance creativity and push the boundaries of what is achievable in the field of integrated circuit design.

Conclusion

Fabrice Baray's contributions to the field of integrated circuits, particularly through his patent focused on glitch failure identification, showcase the importance of innovation in technology. By enhancing the diagnostic processes of integrated circuits, he plays a crucial role in improving the overall reliability of electronic devices in today's digital age.