Naples, Italy

Fabio Cuomo

This inventor holds 1 USPTO granted patent. Top assignee: Stmicroelectronics S.r.l.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fabio Cuomo. Retrieved from https://idiyas.com/inventor/fabio-cuomo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Fabio Cuomo - Innovator in Smart Card Personalization

Introduction

Fabio Cuomo is a notable inventor based in Naples, Italy. He has made significant contributions to the field of smart card technology. His innovative approach has led to the development of a unique method for personalizing smart cards in production chains.

Latest Patents

Fabio Cuomo holds a patent for a "Method for serial personalization of smart cards." This method involves detecting a personalized and physically defective smart card within a production chain. It also includes retrieving a serial number from the defective card to assign it to a smart card that has not yet been personalized. The process ensures that the defective card is rendered unusable while the new card receives the necessary serial number, enhancing efficiency in production.

Career Highlights

Fabio Cuomo is currently employed at STMicroelectronics S.r.l., a leading company in semiconductor solutions. His work focuses on improving the production processes of smart cards, contributing to advancements in the industry.

Collaborations

Throughout his career, Fabio has collaborated with talented professionals such as Giancarlo Pasquariello and Paolo Morelli. These collaborations have fostered innovation and have been instrumental in the development of new technologies.

Conclusion

Fabio Cuomo's contributions to smart card personalization demonstrate his commitment to innovation and efficiency in technology. His patent reflects a significant advancement in the field, showcasing his expertise and dedication to improving production processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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