Nienhagen, Germany

Fabian Sehm

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: International Business Machines Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fabian Sehm. Retrieved from https://idiyas.com/inventor/fabian-sehm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Fabian Sehm: Inventor in Computing Systems

Introduction

Fabian Sehm is an inventor based in Nienhagen, Germany. His patent work includes a method for identifying and remedying failures in computer systems.

Latest Patents

Sehm is associated with 1 patent: “Failure Remedy in Computing Systems Using Action Pattern Database.” The invention describes building a database of entries that connect failures observed in computer systems with action patterns for addressing them. These patterns identify relevant log files. When a system detects a failure, it can find matching entries and use their action patterns to extract debugging data. At least some of that data is sent to an external system, which can return instructions for remedying the failure.

Career Highlights

Sehm’s listed patent is associated with International Business Machines Corporation (IBM). The invention focuses on using prior failure information and targeted log data to support troubleshooting in computing systems.

Collaborations

The patent connects Sehm’s work with IBM and describes a process involving an external system that receives debugging data and provides remedial instructions.

Conclusion

Fabian Sehm’s patent presents a database-driven approach to diagnosing computer failures and obtaining instructions to address them.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…