Yehud, Israel

Eyal Fingold

This inventor holds 1 USPTO granted patent. Top assignee: Micro Focus Lcc. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eyal Fingold. Retrieved from https://idiyas.com/inventor/eyal-fingold-zaauyp43

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Eyal Fingold: Innovator in Application Testing

Introduction

Eyal Fingold is a notable inventor based in Yehud, Israel. He has made significant contributions to the field of application testing, showcasing his expertise through his innovative patent.

Latest Patents

Eyal Fingold holds a patent related to application testing. The patent focuses on identifying a set of tests for applications and determining attributes associated with each test. These attributes include average execution duration, last execution time, and last execution status. The invention also allows for the calculation of attribute scores and user-defined weights, ultimately enabling the sorting and execution of tests based on their scores. This innovation enhances the efficiency and effectiveness of application testing processes.

Career Highlights

Eyal Fingold is currently employed at Micro Focus LLC, where he continues to develop and refine his ideas in application testing. His work at Micro Focus has allowed him to collaborate with other talented professionals in the field.

Collaborations

Some of Eyal's coworkers include David Peer and Clement Arnaud Gaston Claude. Their collaboration fosters a creative environment that encourages innovation and the development of new ideas.

Conclusion

Eyal Fingold's contributions to application testing through his patent demonstrate his commitment to innovation in technology. His work at Micro Focus LLC and collaborations with talented colleagues further enhance his impact in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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