Yongin-si, South Korea

Eunjung Oh

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Display Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eunjung Oh. Retrieved from https://idiyas.com/inventor/eunjung-oh-gtyryjbr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Eunjung Oh and Display Gamma Voltage Correction.

Introduction

Eunjung Oh is an inventor based in Yongin-si, South Korea. Her work includes a patent concerning gamma voltage correction for display devices, an area of technology focused on adjusting display output across different regions and gray levels.

Latest Patents

Oh is associated with 1 patent: “Gamma Voltage Correction Device and Gamma Voltage Correction Method for Display Device.” The method corrects gamma voltage for each sub-pixel in a first display area using measured light characteristics from that area across multiple gray levels. For a second display area, it uses measurements from both the second area and a surrounding portion of the first display area. This approach accounts for regional light characteristics when calibrating the display.

Career Highlights

The available information identifies Oh’s work at Samsung Display Co., Ltd. Her patent addresses display calibration through area-specific gamma voltage correction.

Collaborations

Oh’s listed coworkers include Sibeak Pyo and Sungjin Kim. The available information does not specify their roles in the patent or their particular contributions.

Conclusion

Eunjung Oh’s patent reflects work on calibrating display devices by using measured light characteristics to correct gamma voltage across distinct display areas.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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