Eung Seook Park

Title: Eung Seook Park: Innovator in Optical Microscopy

Introduction

Eung Seook Park is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of optical microscopy, particularly in the detection of nanowires. His innovative approach has the potential to enhance the fabrication of electronic devices.

Latest Patents

Eung Seook Park holds a patent for an "Optical microscope system for detecting nanowires using polarizer and fast fourier transform." This optical microscope system is designed to utilize an existing optical microscope for the fabrication of electronic devices that incorporate nanowires. The system includes a light source that emits light to a nanowire sample, a rotational polarizer that polarizes the emitted light, and an optical microscope that detects the nanowire image using the polarized light. Additionally, a CCD camera is integrated into the optical microscope for photographing and storing the detected nanowire image. A data processor performs Fast Fourier Transform (FFT) on the stored image, allowing for detailed analysis. The intensity of reflected light varies due to the optical anisotropy of the nanowires along the polarizing orientation of the incident light.

Career Highlights

Eung Seook Park is affiliated with the Electronics and Telecommunications Research Institute, where he continues to advance research in optical technologies. His work has garnered attention for its practical applications in electronic device fabrication.

Collaborations

He has collaborated with notable colleagues, including Eun Kyoung Kim and Seung Eon Moon, contributing to various projects within the institute.

Conclusion

Eung Seook Park's innovative contributions to optical microscopy and nanowire detection exemplify the intersection of technology and research. His work not only enhances the understanding of nanowires but also paves the way for advancements in electronic device fabrication.