The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2010
Filed:
Nov. 15, 2007
Eun Kyoung Kim, Daejeon, KR;
Seung Eon Moon, Daejeon, KR;
Hong Yeol Lee, Chungcheongbuk-do, KR;
Jong Hyurk Park, Daegu, KR;
Kang Ho Park, Daejeon, KR;
Jong Dae Kim, Daejeon, KR;
Gyu Tae Kim, Seoul, KR;
DO Young Jang, Seoul, KR;
Eung Seook Park, Seoul, KR;
Hyun Jin Ji, Seoul, KR;
Eun Kyoung Kim, Daejeon, KR;
Seung Eon Moon, Daejeon, KR;
Hong Yeol Lee, Chungcheongbuk-do, KR;
Jong Hyurk Park, Daegu, KR;
Kang Ho Park, Daejeon, KR;
Jong Dae Kim, Daejeon, KR;
Gyu Tae Kim, Seoul, KR;
Do Young Jang, Seoul, KR;
Eung Seook Park, Seoul, KR;
Hyun Jin Ji, Seoul, KR;
Abstract
Provided is an optical microscope system for detecting nanowires to allow for use of an existing optical microscope in fabricating an electronic device having the nanowires and including: a light source for emitting light to provide the light to a nanowire sample; a rotational polarizer provided on a path of the light emitted from the light source for polarizing the light; an optical microscope for detecting a nanowire image using light that is polarized by the rotational polarizer and incident on the nanowire sample; a CCD camera provided in a region of the optical microscope for photographing and storing the nanowire image detected by the optical microscope; and a data processor for performing Fast Fourier Transform (FFT) on the nanowire image stored in the CCD camera. Intensity of reflected light varies, due to optical anisotropy of the nanowires, along a polarizing orientation of light incident on the nanowires.